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Luceo Technologies combines decades of experience in Opto-Electronic testing and Industrial System design to provide telecom customers with best in class High Speed testing solutions. Component and System design engineers rely on Luceo products and services to verify functionality and quality of their high data rate opto-electronic component designs.
XBERT is a low-cost, modular Bit Error Rate Test Platform used for verification and test of 8 Gb/s up to 11.3 Gb/s optical and electrical chip, sub assembly and system designs. ParalleX™ allows users to perform several BER tests at once using a single clock source. The system is ideal for developers desiring to run simultaneous BER tests on parallel interfaces or multiple independent interfaces. XBERT and ParalleX™ are scalable so users can start off with a single channel and add modules to grow the system. Manufacturers can realize great savings by taking advantage of the XBERT and ParalleX™ system? scalability to perform parallel testing in volume production environments.
XBERT 19"/2 Frame shown with PS, CDR, CLK DIV, XFP, EBERT, CLK Source |
ParalleXTM 19" Frame shown with PS, 6-EBERTs, CDR and CLK Source | |
