可扩展架构-随时添加更多测量站

绝对波长精度+/-0.002nm

每个测量站最多有128个检测通道

远端激光光源最多可有8个测量站共享

高速扫描（可有客户控制），速度高达40nm/s

灵活、便于使用的软件

通过动态链路库（DLL）实现订制应用

每天24小时，每周7天服务和支持

 

研发和制造环境中光学器件和模块的特性确定

-Roadm、波长开关、波长阻断器

-电路板

-密集波分复用器（DWDM）

-可调谐滤波器、耦合器、分路器、开关、衰减器、光纤光栅（FBG）、光交错梳妆滤波器

二向色滤光片

-微机电系统（MEMS）和波导器件

-符合IEC 61300-3-29、IEC 61300-3-12

 

波长扫描系统SWS2000系列是插入损耗（IL）、极化依赖性损耗（PDL）、回波损耗（RL）和方向性的行业标准解决方案，在研发与开发以及制造环境中都能达到较高的波长分辨率。目前已有80多家客户采用SWS测试平台，共部署了8500多检测通道，用于验证最新的光学器件和模块的光学性能，包括ROADM、波长开关、可调谐滤波器和电路板。SWS系统由一个可调谐激光源、一个光源模块、一个控制模块、一个接收器机框、一个或多个检测模块以及应用软件组成。

SWS2000在整个1520-1630nm范围内的绝对波长精度+/-0.002nm，扫描速度高达40nm/s，动态范围>70dB，以较低的拥有成本实现了极高的性能；对每一个激光源，分布式基础架构最多可支持8个单独控制的独立测量站。SWS系统最初一般是作为一种研发工具购买，其测量站数目的可扩展性让客户能实现设备从研发部门到制造部门的灵活过渡。

可提供从已有SWS系统到SWS2000平台的升级包，以保证已有SWS用户从已有的基础架构中获得最大的效益。


规格参数

Parameter
Wavelength range	C+L-band 1520 to 1630 nm
Absolute wavelength accuracy	±2 pm
Measurement resolution1	1 pm
Wavelength sampling resolution	3 pm
Insertion loss (IL) measurement accuracy	±0.05 dB (0 to 25 dB device IL)
including polarization state averaged IL2, 3	±0.10 dB (25 to 45 dB device IL) ± 0.20 dB (45 to 65 dB device IL)
Dynamic range3	>70 dB
Loss measurement repeatability2, 3, 4	±0.02 dB
Loss measurement resolution	0.01 dB
Return loss (RL) measurement range3, 5	60 dB
Polarization dependent loss (PDL) measurement accuracy	±0.05 dB (0 to 20 dB device IL)
using standard detector module SWS151072	±0.10 dB (20 to 40 dB device IL)
PDL measurement accuracy	±0.01 dB (0 to 20 dB device IL)
with 13-point smoothing and 4 averages2	±0.03 dB (20 to 40 dB device IL)
PDL measurement repeatability2, 3, 4	±0.01 dB
PDL measurement resolution1	0.01 dB
Maximum slope resolution	10 dB/pm (0 to 35 dB device IL)
Measurement time	9 s ±0.5 s per channel
Maximum scan speed6, 7	40 nm/s
Fiber type (to device-under-test)	SMF-28
Maximum outputs from device under test (DUT) measured	128
Measurement stations per transmitter	Up to 8, in 1, 2, 4, or 8 steps
Detector adapters	FC, SC, ST, LC, bare fiber
Input voltage	110 to 230 V AC , 50 to 60 Hz
Receiver control	Custom interface for Windows 95/98/2000/XP
Receiver communication with computer	National InstrumentsTM PCI interface card
Operating temperature	15 to 30°C
Storage temperature	0 to 70°C
Operating humidity	80% RH maximum, non-condensing
Dimensions (W x H x D)
Source optics module(SOM) (SWS20010-B-2)	48.3 x 13.3 x 37.5 cm
Tunable laser source (SWS17101)	48.3 x 13.3 x 43.2 cm
Receiver chassis (OWB10002)	48.3 x 13.3 x 46.0 cm
Control and detector modules	Plugged into chassis

1. Wavelength resolution defined as the minimum calculated center wavelength shift.

2. Does not include influence of connector.

3. Device IL range/dynamic range both reduced for multiple output SOM.

4. Measurement repeatability conditions:

a. Polarization state averaged insertion loss.

b. Loss less than 20 dB.

c. Measurement performed within 15 minutes of taking reference.

d. Measurement performed within ±3 °C

5. RL module SWS20005 required.

6. 10 and 20 nm/s also selectable.
7. All other specifications are maintained when using a scan speed of 20 nm/s.